Method for defect review measurement on a substrate, apparatus for imaging a substrate, and method of operating thereof
US-2026036536-A1 · Feb 5, 2026 · US
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Li Lingjia patents
Li Lingjia is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Li Lingjia |
| Total patents | 1 |
| First publication | Feb 5, 2026 |
| Latest publication | Feb 5, 2026 |
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06V2201/06 | 1 |
| G06V10/759 | 1 |
| G06T2207/30148 | 1 |
| G06T2207/10061 | 1 |
| G01N2223/6116 | 1 |