Differential phase contrast microanalysis using energy loss spectrometers
US-2025069847-A1 · Feb 27, 2025 · US
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Lazic Ivan patents
Lazic Ivan is listed as an inventor on 18 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lazic Ivan |
| Total patents | 18 |
| First publication | Jun 18, 2015 |
| Latest publication | Feb 27, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and Scanning Transmission Charged-Particle Microscope
US-2023352269-A1 · Nov 2, 2023 · US
Discriminative imaging technique in scanning transmission charged particle microscopy
US-10699872-B2 · Jun 30, 2020 · US
Intelligent pre-scan in scanning transmission charged particle microscopy
US-10665419-B2 · May 26, 2020 · US
Method of performing tomographic imaging in a charged-particle microscope
US-10573488-B2 · Feb 25, 2020 · US
Method of performing tomographic imaging in a charged-particle microscope
US-2019348254-A1 · Nov 14, 2019 · US
Imaging technique in scanning transmission charged particle microscopy
US-10446366-B1 · Oct 15, 2019 · US
Intelligent pre-scan in scanning transmission charged particle microscopy
US-2019295814-A1 · Sep 26, 2019 · US
Discriminative imaging technique in scanning transmission charged particle microscopy
US-2019272974-A1 · Sep 5, 2019 · US
Method of performing tomographic imaging in a charged-particle microscope
US-10403469-B2 · Sep 3, 2019 · US
Recent patents
Latest publications not already listed above.
Method of ptychographic imaging
US-9959639-B2 · May 1, 2018 · US
Method of ptychographic imaging
US-2017024908-A1 · Jan 26, 2017 · US
Method of performing tomographic imaging in a charged-particle microscope
US-2016307729-A1 · Oct 20, 2016 · US
Method of examining a sample in a charged-particle microscope
US-9312098-B2 · Apr 12, 2016 · US
Method of investigating the wavefront of a charged-particle beam
US-9202670-B2 · Dec 1, 2015 · US
Method of investigating and correcting aberrations in a charged-particle lens system
US-9136087-B2 · Sep 15, 2015 · US
Method of examining a sample in a charged-particle microscope
US-2015243474-A1 · Aug 27, 2015 · US
Method of investigating the wavefront of a charged-particle beam
US-2015170876-A1 · Jun 18, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 18 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J2237/2802 | 15 |
| H01J37/28 | 15 |
| H01J37/222 | 12 |
| H01J37/244 | 11 |
| H01J37/265 | 8 |