Apparatus and method for inspecting semiconductor device
US-12436106-B2 · Oct 7, 2025 · US
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Jeon Minji patents
Jeon Minji is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Jeon Minji |
| Total patents | 2 |
| First publication | Mar 7, 2024 |
| Latest publication | Oct 7, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Apparatus and method for inspecting semiconductor device
US-2024077424-A1 · Mar 7, 2024 · US
Recent patents
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01J3/4412 | 2 |
| G01J3/0216 | 2 |
| G01J3/2803 | 2 |
| G01J3/28 | 2 |
| G01J3/44 | 2 |