Photoelectric sensor and threshold setting method
US-12366657-B2 · Jul 22, 2025 · US
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Iida Yusuke patents
Iida Yusuke is listed as an inventor on 32 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Iida Yusuke |
| Total patents | 32 |
| First publication | Feb 3, 2015 |
| Latest publication | Jul 22, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Perovskite-type composite oxide powder
US-2025167251-A1 · May 22, 2025 · US
Vehicle and battery pack
US-2025118847-A1 · Apr 10, 2025 · US
Sensor device and detection method
US-12181577-B2 · Dec 31, 2024 · US
Electrostatic separator
US-11986839-B2 · May 21, 2024 · US
Electrostatic separator and electrostatic separation method
US-11944983-B2 · Apr 2, 2024 · US
Electrostatic separator
US-2023405604-A1 · Dec 21, 2023 · US
Electrostatic separator and electrostatic separation method
US-2023398553-A1 · Dec 14, 2023 · US
Sensor system
US-11774464-B2 · Oct 3, 2023 · US
Photoelectric sensor and threshold setting method
US-2023057540-A1 · Feb 23, 2023 · US
Recent patents
Latest publications not already listed above.
Scanning electron microscopy system and pattern depth measurement method
US-11545336-B2 · Jan 3, 2023 · US
Sensor system, master unit, prediction device, and prediction method
US-2022390925-A1 · Dec 8, 2022 · US
Sensor device and measurement method
US-11506787-B2 · Nov 22, 2022 · US
Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus
US-11302513-B2 · Apr 12, 2022 · US
Displacement sensor
US-11294057-B2 · Apr 5, 2022 · US
Sensor device and detection method
US-2021389458-A1 · Dec 16, 2021 · US
Scanning electron microscopy system and pattern depth measurement method
US-2021027983-A1 · Jan 28, 2021 · US
Sensor system
US-2021018528-A1 · Jan 21, 2021 · US
Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus
US-2021012998-A1 · Jan 14, 2021 · US
Periodic light projecting sensor control device and sensor system ensuring mutual interference does not occur
US-10705248-B2 · Jul 7, 2020 · US
Sensor device and measurement method
US-2020209395-A1 · Jul 2, 2020 · US
Input device, input control method, and input control program
US-10642486-B2 · May 5, 2020 · US
Photosensor and sensor system
US-10416346-B2 · Sep 17, 2019 · US
Displacement sensor
US-2019129033-A1 · May 2, 2019 · US
Optical sensor and detection method
US-2019128732-A1 · May 2, 2019 · US
Photosensor and sensor system
US-2018267203-A1 · Sep 20, 2018 · US
Sensor control device and sensor system
US-2018224570-A1 · Aug 9, 2018 · US
Sensor system having a plurality of coupled sensors
US-9291497-B2 · Mar 22, 2016 · US
Pattern inspection method and pattern inspection apparatus
US-9176074-B2 · Nov 3, 2015 · US
Defect detection method
US-2015268177-A1 · Sep 24, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Omron Tateisi Electronics Co | 18 |
| Hitachi High Tech Corp | 4 |
| Kawasaki Heavy Ind Ltd | 4 |
| Toshiba Kk | 2 |
| Sony Computer Entertainment Inc | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.