Charged particle microscope systems and clustering processes for high dynamic range sample analysis
US-2022207256-A1 · Jun 30, 2022 · US
Howell Garth is listed as an inventor on 9 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Howell Garth |
| Total patents | 9 |
| First publication | May 7, 2015 |
| Latest publication | Jun 30, 2022 |
Publications ranked by popularity score, then publication date.
US-2022207256-A1 · Jun 30, 2022 · US
US-9719950-B2 · Aug 1, 2017 · US
US-9714908-B2 · Jul 25, 2017 · US
US-9495786-B2 · Nov 15, 2016 · US
US-2016245762-A1 · Aug 25, 2016 · US
US-2016063749-A1 · Mar 3, 2016 · US
US-9183656-B2 · Nov 10, 2015 · US
US-2015262400-A1 · Sep 17, 2015 · US
US-2015122992-A1 · May 7, 2015 · US
Latest publications not already listed above.
No data yet.
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 9 |
| Fei Compan | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N23/2252 | 6 |
| G06T5/50 | 5 |
| G06T11/10 | 4 |
| G01N23/203 | 4 |
| G01N23/2206 | 4 |