Device and method for measuring a substrate
US-2026036511-A1 · Feb 5, 2026 · US
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Gasiorowski Jacek patents
Gasiorowski Jacek is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Gasiorowski Jacek |
| Total patents | 3 |
| First publication | Dec 8, 2022 |
| Latest publication | Feb 5, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Device and method for measuring a substrate
US-12467850-B2 · Nov 11, 2025 · US
Device and method for measuring a substrate
US-2022390356-A1 · Dec 8, 2022 · US
Recent patents
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Ev Group E Thallner Gmbh | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N2201/06113 | 3 |
| G01N21/9501 | 3 |
| G01N21/25 | 3 |
| G06F30/20 | 3 |
| G03F7/706843 | 3 |