Variable aperture estimation using bottom-up ray tracing
US-11255993-B2 · Feb 22, 2022 · US
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Gaines David patents
Gaines David is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Gaines David |
| Total patents | 4 |
| First publication | Jan 29, 2015 |
| Latest publication | Feb 22, 2022 |
Notable patents
Publications ranked by popularity score, then publication date.
Dual-loop control for laser annealing of semiconductor wafers
US-9475150-B2 · Oct 25, 2016 · US
Systems and methods for measuring high-intensity light beams
US-8988674-B2 · Mar 24, 2015 · US
Systems and methods for measuring high-intensity light beams
US-2015029497-A1 · Jan 29, 2015 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Ultratech Inc | 3 |
| Gaines David | 2 |
| Mcwhirter James T | 1 |
| Lee Joseph | 1 |
| Zambon Paulo | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01J1/4257 | 2 |
| G01J1/0407 | 2 |
| G01J2001/0481 | 2 |
| G01J1/0477 | 2 |
| G02B5/04 | 2 |