System and method for optical wafer characterization with image up-sampling
US-12524867-B2 · Jan 13, 2026 · US
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Cong Ge patents
Cong Ge is listed as an inventor on 20 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Cong Ge |
| Total patents | 20 |
| First publication | May 7, 2020 |
| Latest publication | Jan 13, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Line marking detection for autonomous and semi-autonomous systems and applications
US-2025297867-A1 · Sep 25, 2025 · US
Feature identification using language models for autonomous systems and applications
US-2025265848-A1 · Aug 21, 2025 · US
Using large language models to augment perception data in environment reconstruction systems and applications
US-2025200283-A1 · Jun 19, 2025 · US
Path marking detection and classification for autonomous and semi-autonomous systems and applications
US-2025078532-A1 · Mar 6, 2025 · US
Using language models to verify map data in map generation systems and applications
US-2024419904-A1 · Dec 19, 2024 · US
Processing sensor data using language models in map generation systems and applications
US-2024419903-A1 · Dec 19, 2024 · US
Using large language models for similarity determinations in content generation systems and applications
US-2024419907-A1 · Dec 19, 2024 · US
Multimode defect detection
US-2024161272-A1 · May 16, 2024 · US
Deep learning based defect detection
US-11776108-B2 · Oct 3, 2023 · US
Recent patents
Latest publications not already listed above.
Setting up inspection of a specimen
US-11748872-B2 · Sep 5, 2023 · US
System and method for optical wafer characterization with image up-sampling
US-2022383470-A1 · Dec 1, 2022 · US
Image alignment for noisy images
US-11494924-B2 · Nov 8, 2022 · US
System and method for determining type and size of defects on blank reticles
US-11468553-B2 · Oct 11, 2022 · US
BBP assisted defect detection flow for SEM images
US-11450012-B2 · Sep 20, 2022 · US
Setting Up Inspection of a Specimen
US-2022067898-A1 · Mar 3, 2022 · US
Deep learning based defect detection
US-2022044391-A1 · Feb 10, 2022 · US
Image alignment for noisy images
US-2021334989-A1 · Oct 28, 2021 · US
BBP Assisted Defect Detection Flow for SEM Images
US-2021133989-A1 · May 6, 2021 · US
System and Method for Determining Type and Size of Defects on Blank Reticles
US-2020143528-A1 · May 7, 2020 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Corp | 13 |
| Nvidia Corp | 7 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 13 |
| G06T7/001 | 11 |
| G06N3/045 | 10 |
| G06N3/08 | 9 |
| G01N21/9501 | 8 |