Use of organic conductive polymer for multiplex ion beam imaging
US-2025179326-A1 · Jun 5, 2025 · US
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Angelo Robert M patents
Angelo Robert M is listed as an inventor on 19 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Angelo Robert M |
| Total patents | 19 |
| First publication | Mar 19, 2015 |
| Latest publication | Jun 5, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Single cell analysis using secondary ion mass spectrometry
US-12135300-B2 · Nov 5, 2024 · US
Features for determining ductal carcinoma in situ recurrence and progression
US-2024044900-A1 · Feb 8, 2024 · US
Single cell analysis using secondary ion mass spectrometry
US-2021310970-A1 · Oct 7, 2021 · US
Single cell analysis using secondary ion mass spectrometry
US-2019339250-A1 · Nov 7, 2019 · US
Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
US-10408814-B2 · Sep 10, 2019 · US
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
US-2019162729-A1 · May 30, 2019 · US
Single cell analysis using secondary ion mass spectrometry
US-10114004-B2 · Oct 30, 2018 · US
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
US-10041949-B2 · Aug 7, 2018 · US
Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
US-2018024111-A1 · Jan 25, 2018 · US
Recent patents
Latest publications not already listed above.
Single cell analysis using secondary ion mass spectrometry
US-2017343529-A1 · Nov 30, 2017 · US
Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
US-9797879-B2 · Oct 24, 2017 · US
Single cell analysis using secondary ion mass spectrometry
US-9766224-B2 · Sep 19, 2017 · US
Apparatus and method for sub-micrometer elemental image analysis by mass spectrometry
US-2017178882-A1 · Jun 22, 2017 · US
Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
US-2016313295-A1 · Oct 27, 2016 · US
Single cell analysis using secondary ion mass spectrometry
US-2016282325-A1 · Sep 29, 2016 · US
Apparatus and method for sub-micrometer elemental image analysis by mass spectrometry
US-9312111-B2 · Apr 12, 2016 · US
Apparatus and method for sub-micrometer elemental image analysis by mass spectrometry
US-2015287578-A1 · Oct 8, 2015 · US
Multiplexed imaging of tissues using mass tags and secondary ion mass spectrometry
US-2015080233-A1 · Mar 19, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Univ Leland Stanford Junior | 19 |
| The Board Of Trustees Ofthe Leland Stanford Junior Univ | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J49/142 | 14 |
| G01N33/6848 | 11 |
| G01N33/4833 | 11 |
| G01N23/2258 | 11 |
| H01J49/0004 | 11 |