Method for measuring spectrum parameters of formation outcrop and rock mass
US-2025060502-A1 · Feb 20, 2025 · US
This patent family groups 1 related publication across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 92390009 |
| Family type | — |
| Earliest priority | May 29, 2024 |
| First filing country | US |
| Member publications | 1 |
| Countries | US |
| Representative publication | US2025060502A1 — Method for measuring spectrum parameters of formation outcrop and rock mass |
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US2025060502A1 — Method for measuring spectrum parameters of formation outcrop and rock mass (published Feb 20, 2025)
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