Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die
US-10923526-B2 · Feb 16, 2021 · US
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Patent family 67904150
This patent family groups 4 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 67904150 |
| Family type | — |
| Earliest priority | Mar 15, 2018 |
| First filing country | US |
| Member publications | 4 |
| Countries | US |
| Representative publication | US10923526B2 — Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die |
Representative publication
Best representative member for this family based on priority and filing country.
US10923526B2 — Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die (published Feb 16, 2021)
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