Semi-supervised anomaly detection in scanning electron microscope images
US-10789703-B2 · Sep 29, 2020 · US
This patent family groups 2 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 67904134 |
| Family type | — |
| Earliest priority | Mar 19, 2018 |
| First filing country | US |
| Member publications | 2 |
| Countries | US |
| Representative publication | US10789703B2 — Semi-supervised anomaly detection in scanning electron microscope images |
Best representative member for this family based on priority and filing country.
US10789703B2 — Semi-supervised anomaly detection in scanning electron microscope images (published Sep 29, 2020)
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