Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
US-11714103-B2 · Aug 1, 2023 · US
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Patent family 62022221
This patent family groups 5 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 62022221 |
| Family type | — |
| Earliest priority | Oct 29, 2016 |
| First filing country | US |
| Member publications | 5 |
| Countries | US |
| Representative publication | US11714103B2 — Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy |
Representative publication
Best representative member for this family based on priority and filing country.
US11714103B2 — Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy (published Aug 1, 2023)
Member publications
Related publications in this family.
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy
US-2021165019-A1 · Jun 3, 2021 · US
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
US-10914755-B2 · Feb 9, 2021 · US
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy
US-2019391177-A1 · Dec 26, 2019 · US
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
US-10228388-B2 · Mar 12, 2019 · US