Electrical connecting device and inspection method
US-11709182-B2 · Jul 25, 2023 · US
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the probes being of different lengths
the probes being of different lengths · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R1/07321 |
| Official title | {the probes being of different lengths} |
| Display label | the probes being of different lengths |
| Total patents | 15 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2017 | 1 |
| 2018 | 3 |
| 2019 | 3 |
| 2020 | 3 |
| 2021 | 2 |
| 2022 | 1 |
| 2023 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Probe head
US-11519938-B2 · Dec 6, 2022 · US
Electrical connecting device and inspection method
US-2021318354-A1 · Oct 14, 2021 · US
Device for measuring surface characteristics of a material
US-11125805-B2 · Sep 21, 2021 · US
Probe head
US-2020393496-A1 · Dec 17, 2020 · US
Low force wafer test probe with variable geometry
US-10663487-B2 · May 26, 2020 · US
Device for measuring surface characteristics of a material
US-2020033395-A1 · Jan 30, 2020 · US
Low force wafer test probe with variable geometry
US-2019195913-A1 · Jun 27, 2019 · US
Probe card system, probe loader device and manufacturing method of the probe loader device
US-10274516-B2 · Apr 30, 2019 · US
Low force wafer test probe with variable geometry
US-10261108-B2 · Apr 16, 2019 · US
Probe card system, probe loader device and manufacturing method of the probe loader device
US-2018321278-A1 · Nov 8, 2018 · US
Manufacturing method of semiconductor device, semiconductor device, and inspection apparatus for semiconductor device
US-2018286766-A1 · Oct 4, 2018 · US
Low force wafer test probe with variable geometry
US-2018017596-A1 · Jan 18, 2018 · US
Testing head of electronic devices
US-9829508-B2 · Nov 28, 2017 · US
Testing head of electronic devices
US-2015309076-A1 · Oct 29, 2015 · US