Device, system and method for automatic test of integrated antennas
US-10564202-B2 · Feb 18, 2020 · US
Sockets or component fixtures for RF or HF testing
Sockets or component fixtures for RF or HF testing · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R1/045 |
| Official title | {Sockets or component fixtures for RF or HF testing} |
| Display label | Sockets or component fixtures for RF or HF testing |
| Total patents | 168 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 5 |
| 2016 | 8 |
| 2017 | 10 |
| 2018 | 15 |
| 2019 | 20 |
| 2020 | 22 |
| 2021 | 22 |
| 2022 | 19 |
| 2023 | 19 |
| 2024 | 12 |
| 2025 | 15 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Semiconductor test system with flexible and robust form factor
US-10551411-B2 · Feb 4, 2020 · US
Over-the-Air Testing of Millimeter Wave Integrated Circuits with Integrated Antennas
US-2019353698-A1 · Nov 21, 2019 · US
Over-the-Air Test Fixture using Antenna Array
US-2019356397-A1 · Nov 21, 2019 · US
High bandwidth differential lead with device connection
US-10481176-B2 · Nov 19, 2019 · US
Wireless test system for testing microelectronic devices integrated with antenna
US-2019310314-A1 · Oct 10, 2019 · US
Test socket
US-2019302144-A1 · Oct 3, 2019 · US
Method and apparatus used for testing a device under test
US-2019271719-A1 · Sep 5, 2019 · US
On-center electrically conductive pins for integrated testing
US-10401386-B2 · Sep 3, 2019 · US
Wave interface assembly for automatic test equipment for semiconductor testing
US-10393772-B2 · Aug 27, 2019 · US
Semiconductor test system with flexible and robust form factor
US-2019250188-A1 · Aug 15, 2019 · US
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
US-10381707-B2 · Aug 13, 2019 · US
Method and apparatus for socket power calibration with flexible printed circuit board
US-10371716-B2 · Aug 6, 2019 · US
Pusher pin having a non-electrically conductive portion
US-10367279-B2 · Jul 30, 2019 · US
Contactors with signal pins, ground pins, and short ground pins
US-2019204357-A1 · Jul 4, 2019 · US
Test fixture for observing current flow through a set of resistors
US-2019187175-A1 · Jun 20, 2019 · US
Testing device, testing system, and testing method
US-2019162774-A1 · May 30, 2019 · US
Semiconductor inspection jig
US-2019137561-A1 · May 9, 2019 · US
Pusher pin having a non-electrically conductive portion
US-2019131728-A1 · May 2, 2019 · US
Waveguide integrated testing
US-10274515-B1 · Apr 30, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R1/045?
- CPC G01R1/045 is the Cooperative Patent Classification code for “Sockets or component fixtures for RF or HF testing.”
- How many patents are filed under CPC G01R1/045 (Sockets or component fixtures for RF or HF testing)?
- Our database includes 168 publications tagged with this CPC code.
- Is patent activity under CPC G01R1/045 growing?
- Publication counts under this code: 12 in 2024 vs 15 in 2025 (latest complete years).