Modified method to fit cell elastic modulus based on Sneddon model
US-11860187-B2 · Jan 2, 2024 · US
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Adhesion force microscopy
Adhesion force microscopy · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q60/28 |
| Official title | Adhesion force microscopy |
| Display label | Adhesion force microscopy |
| Total patents | 21 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2016 | 1 |
| 2017 | 4 |
| 2018 | 1 |
| 2019 | 2 |
| 2020 | 2 |
| 2022 | 4 |
| 2023 | 3 |
| 2024 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
In situ mechanical characterization of a single cell-cell adhesion interface under large strain
US-11846611-B2 · Dec 19, 2023 · US
In situ mechanical characterization of a sample strain
US-2023393170-A1 · Dec 7, 2023 · US
Method for adhesion force prediction through sequential contact analysis of nano-asperity and recording medium recording program for performing the method
US-2023055954-A1 · Feb 23, 2023 · US
In situ mechanical characterization of a single cell-cell adhesion interface under large strain
US-2022082483-A1 · Mar 17, 2022 · US
Modified method to fit cell elastic modulus based on sneddon model
US-2022043025-A1 · Feb 10, 2022 · US
Determining interfacial tension for fluid-fluid-solid environments
US-11243156-B2 · Feb 8, 2022 · US
Determining interfacial tension for fluid-fluid-solid environments
US-2022011212-A1 · Jan 13, 2022 · US
Testing device and method for measuring adhesion force between gas hydrate and mineral particles
US-10775406-B2 · Sep 15, 2020 · US
Testing device and method for measuring adhesion force between gas hydrate and mineral particles
US-2020174037-A1 · Jun 4, 2020 · US
Cantilever set for atomic force microscopes, substrate surface inspection apparatus including the same, method of analyzing surface of semiconductor substrate by using the same, and method of forming micropattern by using the same
US-10352964-B2 · Jul 16, 2019 · US
Method for detecting toxic metal ions in sample
US-10254268-B2 · Apr 9, 2019 · US
Method for determining antifouling ability of a material surface and determining device for determining antifouling ability of material surface
US-10006934-B2 · Jun 26, 2018 · US
Method for detecting toxic metal ions in sample
US-2017307581-A1 · Oct 26, 2017 · US
Method for determining antifouling ability of a material surface and determining device for determining antifouling ability of material surface
US-2017299627-A1 · Oct 19, 2017 · US
Cantilever set for atomic force microscopes, substrate surface inspection apparatus including the same, method of analyzing surface of semiconductor substrate by using the same, and method of forming micropattern by using the same
US-2017212145-A1 · Jul 27, 2017 · US
Exploitation of second-order effects in atomic force microscopy
US-9541575-B2 · Jan 10, 2017 · US
Exploitation of second-order effects in atomic force microscopy
US-2016146853-A1 · May 26, 2016 · US
Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy
US-9110094-B2 · Aug 18, 2015 · US
Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy
US-2015204903-A1 · Jul 23, 2015 · US