Image Acquisition Method and Scanning Transmission Electron Microscope
US-2025354945-A1 · Nov 20, 2025 · US
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diffraction cameras
diffraction cameras · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N2223/0561 |
| Official title | diffraction cameras |
| Display label | diffraction cameras |
| Total patents | 15 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2019 | 2 |
| 2020 | 3 |
| 2021 | 3 |
| 2022 | 4 |
| 2023 | 1 |
| 2024 | 1 |
| 2025 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Device for hosting a probe solution of molecules in a plurality of independent cells
US-11933746-B2 · Mar 19, 2024 · US
Apparatus for inspecting semiconductor device and method for inspecting semiconductor device
US-11703465-B2 · Jul 18, 2023 · US
Device for hosting a probe solution of molecules in a plurality of independent cells
US-2022404296-A1 · Dec 22, 2022 · US
Method of examining a sample using a charged particle microscope
US-11519871-B2 · Dec 6, 2022 · US
Methods and systems for semiconductor metrology based on wavelength resolved soft X-ray reflectometry
US-11460418-B2 · Oct 4, 2022 · US
Apparatus for inspecting semiconductor device and method for inspecting semiconductor device
US-2022065802-A1 · Mar 3, 2022 · US
Dual beam microscope system for imaging during sample processing
US-2021391145-A1 · Dec 16, 2021 · US
Dual beam microscope system for imaging during sample processing
US-11183364-B1 · Nov 23, 2021 · US
Methods And Systems For Semiconductor Metrology Based On Wavelength Resolved Soft X-Ray Reflectometry
US-2021063329-A1 · Mar 4, 2021 · US
Method of examining a sample using a charged particle microscope
US-2020355633-A1 · Nov 12, 2020 · US
Method for determining the concentration of an element of a heteroepitaxial layer
US-10718726-B2 · Jul 21, 2020 · US
Recrystallization rate measurement method of zirconium alloy cladding of nuclear fuel rod using EBSD pattern quality
US-10641719-B2 · May 5, 2020 · US
Recrystallization Rate Measurement Method of Zirconium Alloy Cladding of Nuclear Fuel Rod Using EBSD Pattern Quality
US-2019154600-A1 · May 23, 2019 · US
Method for Determining the Concentration of an Element of a Heteroepitaxial Layer
US-2019113468-A1 · Apr 18, 2019 · US