Inspection method, substrate processing method including the same, and substrate processing device using the substrate processing method
US-12449375-B2 · Oct 21, 2025 · US
Measuring ratio of two lines, e.g. internal standard · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01J2003/4435 |
| Official title | {Measuring ratio of two lines, e.g. internal standard} |
| Display label | Measuring ratio of two lines, e.g. internal standard |
| Total patents | 5 |
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2019 | 1 |
| 2021 | 1 |
| 2022 | 1 |
| 2024 | 1 |
| 2025 | 1 |
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
US-12449375-B2 · Oct 21, 2025 · US
US-2024201103-A1 · Jun 20, 2024 · US
US-2022382834-A1 · Dec 1, 2022 · US
US-2021364423-A1 · Nov 25, 2021 · US
US-10508952-B1 · Dec 17, 2019 · US