System and method for correcting optical path length measurement errors
US-11920928-B2 · Mar 5, 2024 · US
This page is not indexed by search engines while we improve data quality.
by measuring path difference independently from interferometer
by measuring path difference independently from interferometer · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01B9/02071 |
| Official title | {by measuring path difference independently from interferometer} |
| Display label | by measuring path difference independently from interferometer |
| Total patents | 23 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2016 | 1 |
| 2017 | 2 |
| 2018 | 2 |
| 2019 | 4 |
| 2020 | 5 |
| 2021 | 2 |
| 2022 | 5 |
| 2024 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Thickness evaluation method of cell sheet
US-11906301-B2 · Feb 20, 2024 · US
System and method for correcting optical path length measurement errors
US-2022357146-A1 · Nov 10, 2022 · US
Spatial accuracy correction method and apparatus
US-11366447-B2 · Jun 21, 2022 · US
Spatial accuracy correction method and apparatus
US-11366448-B2 · Jun 21, 2022 · US
Thickness evaluation method of cell sheet
US-2022090909-A1 · Mar 24, 2022 · US
Optical coherence tomographic device comprising dual correction beams of different path lengths
US-11243066-B2 · Feb 8, 2022 · US
Automatic calibration optical interferometer and automatic calibration method of optical interferometer
US-10890429-B2 · Jan 12, 2021 · US
Position measurement system, zeroing method, lithographic apparatus and device manufacturing method
US-10883816-B2 · Jan 5, 2021 · US
Automatic calibration optical interferometer and automatic calibration method of optical interferometer
US-2020208958-A1 · Jul 2, 2020 · US
Position measurement system, zeroing method, lithographic apparatus and device manufacturing method
US-2020191552-A1 · Jun 18, 2020 · US
Fiber-coupled phased array of photonic integrated circuit imagers
US-10663282-B1 · May 26, 2020 · US
Method and system for calculating a height map of a surface of an object from an image stack in scanning optical 2.5D profiling of the surface by an optical system
US-10636157-B2 · Apr 28, 2020 · US
Swept-source optical coherence tomography (SS-OCT) phase stabilization with reference signal calibration
US-10627212-B2 · Apr 21, 2020 · US
Optical coherence tomographic device
US-2019195614-A1 · Jun 27, 2019 · US
Spatial accuracy correction method and apparatus
US-2019187660-A1 · Jun 20, 2019 · US
Spatial accuracy correction method and apparatus
US-2019187661-A1 · Jun 20, 2019 · US
Optical coherence tomography microscopy apparatus and method for detecting a three-dimensional image of an object
US-10215552-B2 · Feb 26, 2019 · US
Method and system for calculating a height map of a surface of an object from an image stack in scanning optical 2.5d profiling of the surface by an optical system
US-2018315207-A1 · Nov 1, 2018 · US
Measurement apparatus for measuring shape of target object, system and manufacturing method
US-2018195858-A1 · Jul 12, 2018 · US