Overlay and Semiconductor Process Control Using a Wafer Geometry Metric
US-2016372353-A1 · Dec 22, 2016 · US
Physics · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01B9/02027 |
| Official title | — |
| Display label | Physics (mapped technology topic) |
| Total patents | 296 |
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 42 |
| 2016 | 27 |
| 2017 | 24 |
| 2018 | 23 |
| 2019 | 23 |
| 2020 | 21 |
| 2021 | 25 |
| 2022 | 35 |
| 2023 | 29 |
| 2024 | 17 |
| 2025 | 24 |
| 2026 | 6 |
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
US-2016372353-A1 · Dec 22, 2016 · US
US-9523569-B2 · Dec 20, 2016 · US
US-2016313112-A1 · Oct 27, 2016 · US
US-2016290789-A1 · Oct 6, 2016 · US
US-9448056-B2 · Sep 20, 2016 · US
US-2016252340-A1 · Sep 1, 2016 · US
US-9372068-B2 · Jun 21, 2016 · US
US-2016161244-A1 · Jun 9, 2016 · US
US-2016153764-A1 · Jun 2, 2016 · US
US-2016146590-A1 · May 26, 2016 · US
US-2016138903-A1 · May 19, 2016 · US
US-2016097631-A1 · Apr 7, 2016 · US
US-9304121-B2 · Apr 5, 2016 · US
US-9267782-B1 · Feb 23, 2016 · US
US-9267878-B2 · Feb 23, 2016 · US
US-2016045106-A1 · Feb 18, 2016 · US
US-9261800-B2 · Feb 16, 2016 · US
US-2016033675-A1 · Feb 4, 2016 · US
US-9204800-B2 · Dec 8, 2015 · US
US-9201004-B2 · Dec 1, 2015 · US
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