Nanoscale thin film deposition systems
US-12168244-B2 · Dec 17, 2024 · US
for measuring roughness or irregularity of surfaces · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01B13/22 |
| Official title | for measuring roughness or irregularity of surfaces |
| Display label | for measuring roughness or irregularity of surfaces |
| Total patents | 10 |
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2017 | 1 |
| 2019 | 1 |
| 2020 | 2 |
| 2021 | 2 |
| 2023 | 2 |
| 2024 | 1 |
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
US-12168244-B2 · Dec 17, 2024 · US
US-2023088746-A1 · Mar 23, 2023 · US
US-11578970-B2 · Feb 14, 2023 · US
US-10942025-B2 · Mar 9, 2021 · US
US-2021033391-A1 · Feb 4, 2021 · US
US-2020249015-A1 · Aug 6, 2020 · US
US-2020158502-A1 · May 21, 2020 · US
US-2019017816-A1 · Jan 17, 2019 · US
US-9600928-B2 · Mar 21, 2017 · US
US-2015170412-A1 · Jun 18, 2015 · US