Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
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Yamamoto Tsuyoshi — Physics
Yamamoto Tsuyoshi holds 3 patents in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Yamamoto Tsuyoshi |
| Technology | Physics |
| Patents in slice | 3 |
| Recent patents in slice | 0 |
| First year | 2015 |
| Last year | 2016 |
Representative patents
Notable publications linking Yamamoto Tsuyoshi to Physics.
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Holder for probe microscope, probe microscope and specimen measurement method
US-2015192604-A1 · Jul 9, 2015 · US
Recent filings
Latest patents from Yamamoto Tsuyoshi in Physics.
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Scanning probe microscope and measuring method using same
US-9423416-B2 · Aug 23, 2016 · US
Holder for probe microscope, probe microscope and specimen measurement method
US-2015192604-A1 · Jul 9, 2015 · US
Related pages
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