Systems And Methods For Measuring Magnetic Fields Produced Within An Electron Microscope
US-2017309447-A1 · Oct 26, 2017 · US
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Sanchez John Eder patents in 2017
Sanchez John Eder was listed as an assignee on 2 patent publications in 2017.
| Metric | Value |
|---|---|
| Company | Sanchez John Eder |
| Year | 2017 |
| Patents | 2 |
Patents
Representative publications for Sanchez John Eder in 2017.
Top CPC classifications
Most common classification codes for Sanchez John Eder in 2017.
| CPC | Patents |
|---|---|
| B22F1/0547 | 1 |
| B22F1/0553 | 1 |
| B22F2301/255 | 1 |
| B22F9/24 | 1 |
| B82Y20/00 | 1 |
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