Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
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Brozek Tomasz — Physics
Brozek Tomasz holds 1 patent in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Brozek Tomasz |
| Technology | Physics |
| Patents in slice | 1 |
| Recent patents in slice | 1 |
| First year | 2025 |
| Last year | 2025 |
Representative patents
Notable publications linking Brozek Tomasz to Physics.
Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
Recent filings
Latest patents from Brozek Tomasz in Physics.
Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
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