Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
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Naderhirn Michael — Physics
Naderhirn Michael holds 1 patent in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Naderhirn Michael |
| Technology | Physics |
| Patents in slice | 1 |
| Recent patents in slice | 0 |
| First year | 2020 |
| Last year | 2020 |
Representative patents
Notable publications linking Naderhirn Michael to Physics.
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Recent filings
Latest patents from Naderhirn Michael in Physics.
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
Method and system for inspecting a surface area for material defects
US-10656096-B2 · May 19, 2020 · US
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