Detecting defects on a wafer using template image matching
US-9311698-B2 · Apr 12, 2016 · US
Moreno Carmela was listed as an assignee on 1 patent publication in 2016.
| Metric | Value |
|---|---|
| Company | Moreno Carmela |
| Year | 2016 |
| Patents | 1 |
Representative publications for Moreno Carmela in 2016.
US-9311698-B2 · Apr 12, 2016 · US
Most common classification codes for Moreno Carmela in 2016.
| CPC | Patents |
|---|---|
| G06T2207/20012 | 1 |
| G06T2207/30148 | 1 |
| G06T7/0004 | 1 |
| H01L22/12 | 1 |
| H01L22/20 | 1 |
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