Method of optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology
US-10325004-B1 · Jun 18, 2019 · US
This page is not indexed by search engines while we improve data quality.
Hench John J patents
Hench John J holds 3 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 3 |
| Recent patents | 0 |
| First publication | Apr 12, 2016 |
| Latest publication | Jun 18, 2019 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Method of optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology
US-10325004-B1 · Jun 18, 2019 · US
Computation efficiency by iterative spatial harmonics order truncation
US-9523800-B2 · Dec 20, 2016 · US
Optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology
US-9310296-B2 · Apr 12, 2016 · US
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Physics | 3 |