Testing device and testing method for quantum battery using semiconductor probe
US-9164149-B2 · Oct 20, 2015 · US
TERAKADO Nobuaki was listed as an assignee on 2 patent publications in 2015.
| Metric | Value |
|---|---|
| Company | TERAKADO Nobuaki |
| Year | 2015 |
| Patents | 2 |
Representative publications for TERAKADO Nobuaki in 2015.
US-9164149-B2 · Oct 20, 2015 · US
US-2015000119-A1 · Jan 1, 2015 · US
Most common classification codes for TERAKADO Nobuaki in 2015.
| CPC | Patents |
|---|---|
| Y02E60/10 | 2 |
| B82Y10/00 | 1 |
| G01R1/06744 | 1 |
| G01R31/3637 | 1 |
| G01R31/3641 | 1 |
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