Electron beam apparatus for visualizing a displacement of an electric field
US-9208994-B2 · Dec 8, 2015 · US
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Morishita Hideo patents in 2015
Morishita Hideo was listed as an assignee on 2 patent publications in 2015.
| Metric | Value |
|---|---|
| Company | Morishita Hideo |
| Year | 2015 |
| Patents | 2 |
Patents
Representative publications for Morishita Hideo in 2015.
Scanning electron microscope
US-9029766-B2 · May 12, 2015 · US
Top CPC classifications
Most common classification codes for Morishita Hideo in 2015.
| CPC | Patents |
|---|---|
| H01J37/28 | 2 |
| H01J2237/153 | 1 |
| H01J2237/202 | 1 |
| H01J2237/20207 | 1 |
| H01J2237/20221 | 1 |
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