Calculation method for local film stress measurements using local film thickness values
US-9625823-B1 · Apr 18, 2017 · US
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Kaack Torsten R — Physics
Kaack Torsten R holds 2 patents in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Kaack Torsten R |
| Technology | Physics |
| Patents in slice | 2 |
| Recent patents in slice | 0 |
| First year | 2015 |
| Last year | 2017 |
Representative patents
Notable publications linking Kaack Torsten R to Physics.
Calculation method for local film stress measurements using local film thickness values
US-9625823-B1 · Apr 18, 2017 · US
Multi-analyzer angle spectroscopic ellipsometry
US-9046474-B2 · Jun 2, 2015 · US
Multi-analyzer angle spectroscopic ellipsometry
US-9046474-B2 · Jun 2, 2015 · US
Multi-analyzer angle spectroscopic ellipsometry
US-9046474-B2 · Jun 2, 2015 · US
Recent filings
Latest patents from Kaack Torsten R in Physics.
Calculation method for local film stress measurements using local film thickness values
US-9625823-B1 · Apr 18, 2017 · US
Calculation method for local film stress measurements using local film thickness values
US-9625823-B1 · Apr 18, 2017 · US
Multi-analyzer angle spectroscopic ellipsometry
US-9046474-B2 · Jun 2, 2015 · US
Multi-analyzer angle spectroscopic ellipsometry
US-9046474-B2 · Jun 2, 2015 · US
Multi-analyzer angle spectroscopic ellipsometry
US-9046474-B2 · Jun 2, 2015 · US
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