Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
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Lee Lie-Quan — Physics
Lee Lie-Quan holds 1 patent in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Lee Lie-Quan |
| Technology | Physics |
| Patents in slice | 1 |
| Recent patents in slice | 0 |
| First year | 2017 |
| Last year | 2017 |
Representative patents
Notable publications linking Lee Lie-Quan to Physics.
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Recent filings
Latest patents from Lee Lie-Quan in Physics.
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
Accurate and fast neural network training for library-based critical dimension (CD) metrology
US-9607265-B2 · Mar 28, 2017 · US
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