Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
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Sharma Manish — Physics
Sharma Manish holds 2 patents in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Sharma Manish |
| Technology | Physics |
| Patents in slice | 2 |
| Recent patents in slice | 0 |
| First year | 2015 |
| Last year | 2019 |
Representative patents
Notable publications linking Sharma Manish to Physics.
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Two-dimensional scan architecture
US-9222978-B2 · Dec 29, 2015 · US
Recent filings
Latest patents from Sharma Manish in Physics.
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Two-dimensional scan architecture
US-9222978-B2 · Dec 29, 2015 · US
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