Method of imaging a sample with a charged particle beam device, method of calibrating a charged particle beam device, and charged particle beam device
US-12562336-B2 · Feb 24, 2026 · US
This page is not indexed by search engines while we improve data quality.
Mueller Bernhard G patents
Mueller Bernhard G holds 4 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 4 |
| Recent patents | 2 |
| First publication | Aug 12, 2021 |
| Latest publication | Feb 24, 2026 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Method of imaging a sample with a charged particle beam device, method of calibrating a charged particle beam device, and charged particle beam device
US-2023253177-A1 · Aug 10, 2023 · US
Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
US-11195691-B2 · Dec 7, 2021 · US
Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
US-2021249220-A1 · Aug 12, 2021 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Method of imaging a sample with a charged particle beam device, method of calibrating a charged particle beam device, and charged particle beam device
US-12562336-B2 · Feb 24, 2026 · US
Method of imaging a sample with a charged particle beam device, method of calibrating a charged particle beam device, and charged particle beam device
US-2023253177-A1 · Aug 10, 2023 · US
Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
US-11195691-B2 · Dec 7, 2021 · US
Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
US-2021249220-A1 · Aug 12, 2021 · US
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Electricity | 4 |
| Physics | 2 |